SEM

The JSM-IT500 is a new model of JEOL InTouchScope™ series.

Equipped with our sophisticated Analytical series, the JSM-IT500 facilitates any analyses from specimen loading to report generation.

Features

Key point 1 : Zeromag

The displayed Holder Graphics or CCD image enables you to locate the specimen area or specify analysis positions. You can rapidly search the specimen area and specify positions for multiple-field serial analysis.

Key point 2 : Live Analysis (Only for A/LA)

With "Live Analysis", the embedded EDS system shows a real time EDS spectrum during image observation. Elemental composition or "Alert" for element of interest is displayed on a live image.

Key point 3 : Integrated data management software

This user-friendly software enables you to select and review SEM images and analysis results through the data management area. You can also generate a report with a single click.

Benchtop scanning electron microscopes are used in a wide range of fields, such as electrical, electronics, automobiles, machinery, chemical, and pharmaceutical industries. In addition, SEM applications are expanding to not only cover research and development, but also address quality control and product inspection at manufacturing sites. With this, demands for further improved work efficiency, much faster and easier operation, and a higher degree of analytical and measurement capabilities, are increasing.

The JCM-7000 Benchtop Scanning Electron Microscope is designed based on a key concept of "Easy-to-use SEM with seamless navigation and live analysis". The JCM-7000 incorporates three innovative functions; "Zeromag" for smooth transition from optical to SEM imaging, "Live Analysis" for finding constituent elements for an image observation area, and "Live 3D" for displaying a reconstructed live 3D image during SEM observation.

When you place the JCM-7000 next to an optical microscope, further-faster and more-detailed foreign material analysis and quality control can be made.